Comparative Analysis of Layer Thickness Measurement Methods for Photovoltaic Modules: A Comprehensive Study

Comparative Analysis of Layer Thickness Measurement Methods for Photovoltaic Modules: A Comprehensive Study

The increasing volume of end‐of‐life (EoL) photovoltaic (PV) modules poses a significant challenge, necessitating efficient and sustainable recycling processes. In the PVReValue project, it is aimed to develop a comprehensive methodology for the systematic separation and recycling of EoL PV modules....

Full description

Saved in:
Bibliographic Details
Main Authors: Lukas Neumaier, Martin De Biasio, Anika Gassner, Gabriele C. Eder, Thomas Nigl
Format: Article
Language:English
Published: Wiley-VCH 2024-12-01
Series:Advanced Energy & Sustainability Research
Subjects:
end‐of‐life
input characterization
layer thickness
photovoltaics
recycling
Online Access:https://doi.org/10.1002/aesr.202400219
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items

Similar Items