Degradation modeling and remaining useful life prediction for electronic device under multiple stress influences

Abstract Power driver devices have functions such as current amplification and power conversion, making them key components of electronic systems. Their degradation is affected by multiple types of stress, making it difficult to establish an accurate degradation model. To monitor the degradation sta...

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Bibliographic Details
Main Authors: Changjun Li, Jinjun Cheng, Haizhen Zhu, Bincheng Wen, Xin Zhao, Weijie Kang
Format: Article
Language:English
Published: Nature Portfolio 2025-05-01
Series:Scientific Reports
Subjects:
Online Access:https://doi.org/10.1038/s41598-025-03786-y
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