Protecting Dynamically Obfuscated Scan Chain Architecture from DOSCrack with Trivium Pseudo-Random Number Generation

Protecting Dynamically Obfuscated Scan Chain Architecture from DOSCrack with Trivium Pseudo-Random Number Generation

Design-for-test/debug (DfT/D) introduces scan chain testing to increase testability and fault coverage by inserting scan flip-flops. However, these scan chains are also known to be a liability for security primitives. In previous research, the dynamically obfuscated scan chain (DOSC) was introduced...

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Bibliographic Details
Main Authors: Jiaming Wu, Olivia Dizon-Paradis, Sazadur Rahman, Damon L. Woodard, Domenic Forte
Format: Article
Language:English
Published: MDPI AG 2025-01-01
Series:Cryptography
Subjects:
scan-based attack
clustering
symbolic execution
logic locking
Online Access:https://www.mdpi.com/2410-387X/9/1/6
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