Topological defects in Floquet circuits
We introduce a Floquet circuit describing the driven Ising chain with topological defects. The corresponding gates include a defect that flips spins as well as the duality defect that explicitly implements the Kramers-Wannier duality transformation. The Floquet unitary evolution operator commutes wi...
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| Main Author: | Mao Tian Tan, Yifan Wang, Aditi Mitra |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
SciPost
2024-03-01
|
| Series: | SciPost Physics |
| Online Access: | https://scipost.org/SciPostPhys.16.3.075 |
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