The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical Stress
In this work, the degradation in luminous characteristics of red, green, and blue (RGB) micro-LEDs (10 µm × 10 µm) under electrical stress at 360 K has been investigated. After 280 h of aging, the AlGaInP-based red micro-LEDs exhibit a 31.7% reduction in maximum external quantum efficiency, which is...
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| Language: | English |
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MDPI AG
2025-06-01
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| Series: | Crystals |
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| Online Access: | https://www.mdpi.com/2073-4352/15/7/604 |
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| author | Changdong Tong Yu Liu Quan Deng Li Pan Guolong Chen Yijun Lu Tingzhu Wu Zhong Chen Weijie Guo |
| author_facet | Changdong Tong Yu Liu Quan Deng Li Pan Guolong Chen Yijun Lu Tingzhu Wu Zhong Chen Weijie Guo |
| author_sort | Changdong Tong |
| collection | DOAJ |
| description | In this work, the degradation in luminous characteristics of red, green, and blue (RGB) micro-LEDs (10 µm × 10 µm) under electrical stress at 360 K has been investigated. After 280 h of aging, the AlGaInP-based red micro-LEDs exhibit a 31.7% reduction in maximum external quantum efficiency, which is significantly greater than the reductions observed in InGaN-based green and blue micro-LEDs. Specifically, the peak wavelength redshift by 0.6 nm, and blueshift 1.0 nm, and 0.5 nm for RGB micro-LEDs, respectively. The color purity of green and blue micro-LEDs decreases by 3.6% and 0.7%, respectively, resulting in a 7% reduction in color gamut. |
| format | Article |
| id | doaj-art-b09d59631ae84ec4b3f097bbf377f9c8 |
| institution | DOAJ |
| issn | 2073-4352 |
| language | English |
| publishDate | 2025-06-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Crystals |
| spelling | doaj-art-b09d59631ae84ec4b3f097bbf377f9c82025-08-20T03:08:10ZengMDPI AGCrystals2073-43522025-06-0115760410.3390/cryst15070604The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical StressChangdong Tong0Yu Liu1Quan Deng2Li Pan3Guolong Chen4Yijun Lu5Tingzhu Wu6Zhong Chen7Weijie Guo8National Innovation Platform for the Fusion of Industry and Education in Integrated Circuits, Department of Electronic Science, School of Electronic Science and Engineering, Xiamen University, Xiamen 361005, ChinaNational Innovation Platform for the Fusion of Industry and Education in Integrated Circuits, Department of Electronic Science, School of Electronic Science and Engineering, Xiamen University, Xiamen 361005, ChinaNational Innovation Platform for the Fusion of Industry and Education in Integrated Circuits, Department of Electronic Science, School of Electronic Science and Engineering, Xiamen University, Xiamen 361005, ChinaAKM Electronic Technology (Suzhou) Co., Ltd., Suzhou 215129, ChinaNational Innovation Platform for the Fusion of Industry and Education in Integrated Circuits, Department of Electronic Science, School of Electronic Science and Engineering, Xiamen University, Xiamen 361005, ChinaNational Innovation Platform for the Fusion of Industry and Education in Integrated Circuits, Department of Electronic Science, School of Electronic Science and Engineering, Xiamen University, Xiamen 361005, ChinaNational Innovation Platform for the Fusion of Industry and Education in Integrated Circuits, Department of Electronic Science, School of Electronic Science and Engineering, Xiamen University, Xiamen 361005, ChinaNational Innovation Platform for the Fusion of Industry and Education in Integrated Circuits, Department of Electronic Science, School of Electronic Science and Engineering, Xiamen University, Xiamen 361005, ChinaNational Innovation Platform for the Fusion of Industry and Education in Integrated Circuits, Department of Electronic Science, School of Electronic Science and Engineering, Xiamen University, Xiamen 361005, ChinaIn this work, the degradation in luminous characteristics of red, green, and blue (RGB) micro-LEDs (10 µm × 10 µm) under electrical stress at 360 K has been investigated. After 280 h of aging, the AlGaInP-based red micro-LEDs exhibit a 31.7% reduction in maximum external quantum efficiency, which is significantly greater than the reductions observed in InGaN-based green and blue micro-LEDs. Specifically, the peak wavelength redshift by 0.6 nm, and blueshift 1.0 nm, and 0.5 nm for RGB micro-LEDs, respectively. The color purity of green and blue micro-LEDs decreases by 3.6% and 0.7%, respectively, resulting in a 7% reduction in color gamut.https://www.mdpi.com/2073-4352/15/7/604micro-LEDelectric and thermal stressluminous degradation |
| spellingShingle | Changdong Tong Yu Liu Quan Deng Li Pan Guolong Chen Yijun Lu Tingzhu Wu Zhong Chen Weijie Guo The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical Stress Crystals micro-LED electric and thermal stress luminous degradation |
| title | The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical Stress |
| title_full | The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical Stress |
| title_fullStr | The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical Stress |
| title_full_unstemmed | The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical Stress |
| title_short | The Performance Degradation of Red, Green, and Blue Micro-LEDs Under High-Temperature Electrical Stress |
| title_sort | performance degradation of red green and blue micro leds under high temperature electrical stress |
| topic | micro-LED electric and thermal stress luminous degradation |
| url | https://www.mdpi.com/2073-4352/15/7/604 |
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