Conversational LLM-Based Decision Support for Defect Classification in AFM Images
Atomic force microscopy (AFM) has emerged as a powerful tool for nanoscale imaging and quantitative characterization of organic (e.g., live cells, proteins, DNA, and lipid bilayers) and inorganic (e.g., silicon wafers and polymers) specimens. However, image artifacts in AFM height and peak force err...
Saved in:
| Main Authors: | , , , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
|
| Series: | IEEE Open Journal of Instrumentation and Measurement |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/11096088/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|