Optical Metrology under Extreme Conditions

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Bibliographic Details
Main Authors: Xide Li, Giancarlo Pedrini, Yu Fu
Format: Article
Language:English
Published: Wiley 2014-01-01
Series:The Scientific World Journal
Online Access:http://dx.doi.org/10.1155/2014/263603
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author Xide Li
Giancarlo Pedrini
Yu Fu
author_facet Xide Li
Giancarlo Pedrini
Yu Fu
author_sort Xide Li
collection DOAJ
format Article
id doaj-art-ae7a263dfe7e4fb8bd215b2aeb1a8dac
institution Kabale University
issn 2356-6140
1537-744X
language English
publishDate 2014-01-01
publisher Wiley
record_format Article
series The Scientific World Journal
spelling doaj-art-ae7a263dfe7e4fb8bd215b2aeb1a8dac2025-02-03T06:00:08ZengWileyThe Scientific World Journal2356-61401537-744X2014-01-01201410.1155/2014/263603263603Optical Metrology under Extreme ConditionsXide Li0Giancarlo Pedrini1Yu Fu2Department of Engineering Mechanics, Tsinghua University, Beijing 100084, ChinaInstitut für Technische Optik, University of Stuttgart, Pfaffenwaldring 9, 70569 Stuttgart, GermanyTemasek Laboratories, Nanyang Technological University, Research Techno Plaza, 50 Nanyang Drive, 637553, Singaporehttp://dx.doi.org/10.1155/2014/263603
spellingShingle Xide Li
Giancarlo Pedrini
Yu Fu
Optical Metrology under Extreme Conditions
The Scientific World Journal
title Optical Metrology under Extreme Conditions
title_full Optical Metrology under Extreme Conditions
title_fullStr Optical Metrology under Extreme Conditions
title_full_unstemmed Optical Metrology under Extreme Conditions
title_short Optical Metrology under Extreme Conditions
title_sort optical metrology under extreme conditions
url http://dx.doi.org/10.1155/2014/263603
work_keys_str_mv AT xideli opticalmetrologyunderextremeconditions
AT giancarlopedrini opticalmetrologyunderextremeconditions
AT yufu opticalmetrologyunderextremeconditions