APA (7th ed.) Citation

Liu, Y., Liu, Q., Chen, J., Mu, Z., Wei, X., & Yu, W. Subthreshold Kink Effect in Gate-All-Around MOSFETs Based on Void Embedded Silicon on Insulator Technology. IEEE.

Chicago Style (17th ed.) Citation

Liu, Yuxin, Qiang Liu, Jin Chen, Zhiqiang Mu, Xing Wei, and Wenjie Yu. Subthreshold Kink Effect in Gate-All-Around MOSFETs Based on Void Embedded Silicon on Insulator Technology. IEEE.

MLA (9th ed.) Citation

Liu, Yuxin, et al. Subthreshold Kink Effect in Gate-All-Around MOSFETs Based on Void Embedded Silicon on Insulator Technology. IEEE.