Retracted: Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology
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| Main Author: | |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2018-01-01
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| Series: | International Journal of Photoenergy |
| Online Access: | http://dx.doi.org/10.1155/2018/9315054 |
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| _version_ | 1832556012405522432 |
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| author | International Journal of Photoenergy |
| author_facet | International Journal of Photoenergy |
| author_sort | International Journal of Photoenergy |
| collection | DOAJ |
| format | Article |
| id | doaj-art-ad2dea6aba104e0a9e316700ff9bc1d4 |
| institution | Kabale University |
| issn | 1110-662X 1687-529X |
| language | English |
| publishDate | 2018-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | International Journal of Photoenergy |
| spelling | doaj-art-ad2dea6aba104e0a9e316700ff9bc1d42025-02-03T05:46:34ZengWileyInternational Journal of Photoenergy1110-662X1687-529X2018-01-01201810.1155/2018/93150549315054Retracted: Radiation Hardness of Flash Memory Fabricated in Deep-Submicron TechnologyInternational Journal of Photoenergyhttp://dx.doi.org/10.1155/2018/9315054 |
| spellingShingle | International Journal of Photoenergy Retracted: Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology International Journal of Photoenergy |
| title | Retracted: Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology |
| title_full | Retracted: Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology |
| title_fullStr | Retracted: Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology |
| title_full_unstemmed | Retracted: Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology |
| title_short | Retracted: Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology |
| title_sort | retracted radiation hardness of flash memory fabricated in deep submicron technology |
| url | http://dx.doi.org/10.1155/2018/9315054 |
| work_keys_str_mv | AT internationaljournalofphotoenergy retractedradiationhardnessofflashmemoryfabricatedindeepsubmicrontechnology |