A Low-Overhead and High-Security Scan Design Based on Scan Obfuscation

A Low-Overhead and High-Security Scan Design Based on Scan Obfuscation

Scan-based side-channel attacks have been proven to be popular attack methods against cryptographic chips. In these attacks, attackers can use scan chains inside a chip to obtain internal sensitive information of the chip, such as crypto key or other secret data. To counteract scan-based side-channe...

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Bibliographic Details
Main Authors: Weizheng Wang, Xingxing Gong, Shuo Cai, Jiamin Liu, Xiangqi Wang
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Access
Subjects:
Cryptographic chips
design for testability
scan obfuscation
scan-based side-channel attacks
Online Access:https://ieeexplore.ieee.org/document/10767141/
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