Characterization of Limit Cycle Oscillations Induced by Fixed Threshold Samplers
In this work, a generalized study of the conditions for the appearance of limit cycle oscillations induced by any kind of sampler with multilevel fixed thresholds is presented. These kinds of samplers, which will be referred to as Fixed Threshold Samplers (FTS), are characterized by a series of para...
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IEEE
2022-01-01
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| Online Access: | https://ieeexplore.ieee.org/document/9795033/ |
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| author | Oscar Miguel-Escrig Julio-Ariel Romero-Perez Jose Sanchez-Moreno Sebastian Dormido |
| author_facet | Oscar Miguel-Escrig Julio-Ariel Romero-Perez Jose Sanchez-Moreno Sebastian Dormido |
| author_sort | Oscar Miguel-Escrig |
| collection | DOAJ |
| description | In this work, a generalized study of the conditions for the appearance of limit cycle oscillations induced by any kind of sampler with multilevel fixed thresholds is presented. These kinds of samplers, which will be referred to as Fixed Threshold Samplers (FTS), are characterized by a series of parameters, which, when selected properly, allow obtaining some of the most used forms of quantization in Event-Based Control (EBC). Because of some sampler characteristics, the obtained limit cycle oscillations can present a bias, therefore, to characterize them the Dual Input Describing Function (DIDF) method is used. The obtained DIDF is analyzed revealing some interesting properties allowing to simplify the robustness analysis. The analysis takes into account the effect of the disturbance and reference signal influence on the system, generally overlooked in DF analysis. Guidelines about how to perform the robustness analysis are given, showing their application through some study cases. |
| format | Article |
| id | doaj-art-ab7acfcd347d4abe9597a78e335e4ea8 |
| institution | Kabale University |
| issn | 2169-3536 |
| language | English |
| publishDate | 2022-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj-art-ab7acfcd347d4abe9597a78e335e4ea82025-08-20T03:31:21ZengIEEEIEEE Access2169-35362022-01-0110625816259610.1109/ACCESS.2022.31827949795033Characterization of Limit Cycle Oscillations Induced by Fixed Threshold SamplersOscar Miguel-Escrig0https://orcid.org/0000-0002-2472-2038Julio-Ariel Romero-Perez1Jose Sanchez-Moreno2https://orcid.org/0000-0002-6702-3771Sebastian Dormido3https://orcid.org/0000-0002-2405-8771Department of System Engineering and Design, Universitat Jaume I (UJI), Castellón de la Plana, SpainDepartment of System Engineering and Design, Universitat Jaume I (UJI), Castellón de la Plana, SpainDepartment of Computer Science and Automatic Control, Universidad Nacional de Educación a Distancia (UNED), Madrid, SpainDepartment of Computer Science and Automatic Control, Universidad Nacional de Educación a Distancia (UNED), Madrid, SpainIn this work, a generalized study of the conditions for the appearance of limit cycle oscillations induced by any kind of sampler with multilevel fixed thresholds is presented. These kinds of samplers, which will be referred to as Fixed Threshold Samplers (FTS), are characterized by a series of parameters, which, when selected properly, allow obtaining some of the most used forms of quantization in Event-Based Control (EBC). Because of some sampler characteristics, the obtained limit cycle oscillations can present a bias, therefore, to characterize them the Dual Input Describing Function (DIDF) method is used. The obtained DIDF is analyzed revealing some interesting properties allowing to simplify the robustness analysis. The analysis takes into account the effect of the disturbance and reference signal influence on the system, generally overlooked in DF analysis. Guidelines about how to perform the robustness analysis are given, showing their application through some study cases.https://ieeexplore.ieee.org/document/9795033/DIDFlimit cyclerobustnesssampling |
| spellingShingle | Oscar Miguel-Escrig Julio-Ariel Romero-Perez Jose Sanchez-Moreno Sebastian Dormido Characterization of Limit Cycle Oscillations Induced by Fixed Threshold Samplers IEEE Access DIDF limit cycle robustness sampling |
| title | Characterization of Limit Cycle Oscillations Induced by Fixed Threshold Samplers |
| title_full | Characterization of Limit Cycle Oscillations Induced by Fixed Threshold Samplers |
| title_fullStr | Characterization of Limit Cycle Oscillations Induced by Fixed Threshold Samplers |
| title_full_unstemmed | Characterization of Limit Cycle Oscillations Induced by Fixed Threshold Samplers |
| title_short | Characterization of Limit Cycle Oscillations Induced by Fixed Threshold Samplers |
| title_sort | characterization of limit cycle oscillations induced by fixed threshold samplers |
| topic | DIDF limit cycle robustness sampling |
| url | https://ieeexplore.ieee.org/document/9795033/ |
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