Contrast analysis for rapid characterization of 2D WTe2 structures
Two-dimensional (2D) layered materials, particularly transition metal dichalcogenides, exhibit unique electronic and optical properties. Among these, tungsten ditelluride (WTe2) has garnered attention for its semi-metallic behavior and topologically nontrivial band structure, making it a promising c...
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2025-04-01
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| Series: | APL Materials |
| Online Access: | http://dx.doi.org/10.1063/5.0253848 |
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| _version_ | 1850281642804903936 |
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| author | Agnese Spustaka Andrejs Terehovs Aris Jansons Gunta Kunakova |
| author_facet | Agnese Spustaka Andrejs Terehovs Aris Jansons Gunta Kunakova |
| author_sort | Agnese Spustaka |
| collection | DOAJ |
| description | Two-dimensional (2D) layered materials, particularly transition metal dichalcogenides, exhibit unique electronic and optical properties. Among these, tungsten ditelluride (WTe2) has garnered attention for its semi-metallic behavior and topologically nontrivial band structure, making it a promising candidate for advanced nanoelectronic applications. A significant challenge, however, lies in achieving scalable characterization, determining thickness and coverage of WTe2 structures. Existing methods are often limited by time constraints and lack suitability for high-throughput workflows. This study introduces a refined workflow combining optical imaging, segmentation, and contrast analysis to address these limitations. Calculated values of normalized optical contrast were correlated with thicknesses determined by atomic force microscopy and were found to scale linearly. The proposed workflow provides a scalable, adaptable solution for 2D material characterization. |
| format | Article |
| id | doaj-art-ab0bf82a77f541058fa5ff994e5b70ad |
| institution | OA Journals |
| issn | 2166-532X |
| language | English |
| publishDate | 2025-04-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | APL Materials |
| spelling | doaj-art-ab0bf82a77f541058fa5ff994e5b70ad2025-08-20T01:48:13ZengAIP Publishing LLCAPL Materials2166-532X2025-04-01134041110041110-710.1063/5.0253848Contrast analysis for rapid characterization of 2D WTe2 structuresAgnese Spustaka0Andrejs Terehovs1Aris Jansons2Gunta Kunakova3Faculty of Science and Technology, Institute of Chemical Physics, University of Latvia, Riga, LatviaFaculty of Science and Technology, Institute of Chemical Physics, University of Latvia, Riga, LatviaFaculty of Science and Technology, Institute of Chemical Physics, University of Latvia, Riga, LatviaFaculty of Science and Technology, Institute of Chemical Physics, University of Latvia, Riga, LatviaTwo-dimensional (2D) layered materials, particularly transition metal dichalcogenides, exhibit unique electronic and optical properties. Among these, tungsten ditelluride (WTe2) has garnered attention for its semi-metallic behavior and topologically nontrivial band structure, making it a promising candidate for advanced nanoelectronic applications. A significant challenge, however, lies in achieving scalable characterization, determining thickness and coverage of WTe2 structures. Existing methods are often limited by time constraints and lack suitability for high-throughput workflows. This study introduces a refined workflow combining optical imaging, segmentation, and contrast analysis to address these limitations. Calculated values of normalized optical contrast were correlated with thicknesses determined by atomic force microscopy and were found to scale linearly. The proposed workflow provides a scalable, adaptable solution for 2D material characterization.http://dx.doi.org/10.1063/5.0253848 |
| spellingShingle | Agnese Spustaka Andrejs Terehovs Aris Jansons Gunta Kunakova Contrast analysis for rapid characterization of 2D WTe2 structures APL Materials |
| title | Contrast analysis for rapid characterization of 2D WTe2 structures |
| title_full | Contrast analysis for rapid characterization of 2D WTe2 structures |
| title_fullStr | Contrast analysis for rapid characterization of 2D WTe2 structures |
| title_full_unstemmed | Contrast analysis for rapid characterization of 2D WTe2 structures |
| title_short | Contrast analysis for rapid characterization of 2D WTe2 structures |
| title_sort | contrast analysis for rapid characterization of 2d wte2 structures |
| url | http://dx.doi.org/10.1063/5.0253848 |
| work_keys_str_mv | AT agnesespustaka contrastanalysisforrapidcharacterizationof2dwte2structures AT andrejsterehovs contrastanalysisforrapidcharacterizationof2dwte2structures AT arisjansons contrastanalysisforrapidcharacterizationof2dwte2structures AT guntakunakova contrastanalysisforrapidcharacterizationof2dwte2structures |