APA (7th ed.) Citation

Ouyang, S., & Liu, L. Test and study on sensitivity of electronic circuit in low‐voltage release to voltage sags. Wiley.

Chicago Style (17th ed.) Citation

Ouyang, Sen, and Liyuan Liu. Test and Study on Sensitivity of Electronic Circuit in Low‐voltage Release to Voltage Sags. Wiley.

MLA (9th ed.) Citation

Ouyang, Sen, and Liyuan Liu. Test and Study on Sensitivity of Electronic Circuit in Low‐voltage Release to Voltage Sags. Wiley.

Warning: These citations may not always be 100% accurate.