Enabling atomic resolution electron microscopy at elevated temperature and beyond pressures of a few bar

Enabling atomic resolution electron microscopy at elevated temperature and beyond pressures of a few bar

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Bibliographic Details
Main Authors: Ambjørner Hjalte, Bjørnlund Anton, Bonczyk Tobias, Dollekamp Edwin, Kaas Lau, Colding-Fagerholt Sofie, Mølhave Kristian, Damsgaard Christian, Helveg Stig, Vesborg Peter
Format: Article
Language:English
Published: EDP Sciences 2024-01-01
Series:BIO Web of Conferences
Subjects:
graphene
thermal
seal
tem
heating
Online Access:https://www.bio-conferences.org/articles/bioconf/pdf/2024/48/bioconf_emc2024_22007.pdf
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ISSN:2117-4458

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