APA (7th ed.) Citation

Ch, S., Lim, R. R., Low, S. W. Y., Grant, D. G., Patterson, S., Ramasubramanian, A., . . . Chaurasia, S. S. A comprehensive overview of focused ion beam-scanning electron microscopy (FIB-SEM) applications for the evaluation of outer retina. Frontiers Media S.A.

Chicago Style (17th ed.) Citation

Ch, Sanjay, Rayne R. Lim, Shermaine W. Y. Low, Deana G. Grant, Sam Patterson, Aparna Ramasubramanian, Ashish K. Gadicherla, Shyam S. Chaurasia, and Shyam S. Chaurasia. A Comprehensive Overview of Focused Ion Beam-scanning Electron Microscopy (FIB-SEM) Applications for the Evaluation of Outer Retina. Frontiers Media S.A.

MLA (9th ed.) Citation

Ch, Sanjay, et al. A Comprehensive Overview of Focused Ion Beam-scanning Electron Microscopy (FIB-SEM) Applications for the Evaluation of Outer Retina. Frontiers Media S.A.