Applying the carbon materials in TSVs array for enhancing heat transfer performance of three-dimensional integrated circuits

This paper proposed the carbon materials (including MLGNR, MWCNT and SWCNT) to replace the traditional Cu as the filler of through silicon via (TSV) for enhancing heat transfer performance of three-dimensional integrated circuits (3-D ICs), meanwhile the corresponding mathematical model is establish...

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Main Authors: Peng Xu, Huan Huang, Songjie Zhao, Xiushan Liu, Fa Zou, Chao Li, Jun Ai, Hui Liu
Format: Article
Language:English
Published: Elsevier 2025-02-01
Series:Case Studies in Thermal Engineering
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Online Access:http://www.sciencedirect.com/science/article/pii/S2214157X24017568
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author Peng Xu
Huan Huang
Songjie Zhao
Xiushan Liu
Fa Zou
Chao Li
Jun Ai
Hui Liu
author_facet Peng Xu
Huan Huang
Songjie Zhao
Xiushan Liu
Fa Zou
Chao Li
Jun Ai
Hui Liu
author_sort Peng Xu
collection DOAJ
description This paper proposed the carbon materials (including MLGNR, MWCNT and SWCNT) to replace the traditional Cu as the filler of through silicon via (TSV) for enhancing heat transfer performance of three-dimensional integrated circuits (3-D ICs), meanwhile the corresponding mathematical model is established to quickly obtain steady-state temperature of each die layer. The results indicated that the steady-state temperature of 3-D ICs with inserted MLGNR, MWCNT and SWCNT based TSVs array are reduced by 23.315 %, 29.043 % and 38.007 % respectively, as compared with Cu as the filler of TSV. Moreover, it is manifested that the heat transfer performance of 3-D ICs can be further improved by increasing the number and radius of TSV. The corresponding steady-state temperature of the scheme of 5 × 6 TSVs array is 10.415 % lower than that of the scheme of 4 × 4 TSVs array, in the meantime the steady-state temperature can be reduced by 16.016 % when the radius of TSV increases from 1.5 μm to 2.5 μm. Furthermore, it is demonstrated that the processor runtime and memory footprint of our proposed model are 46.938 and 6.771 times lower than COMSOL simulation model, and the maximum error between them is not exceeding 3 %.
format Article
id doaj-art-a9cc9813b28649d5b8f9aef75fc1097d
institution Kabale University
issn 2214-157X
language English
publishDate 2025-02-01
publisher Elsevier
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series Case Studies in Thermal Engineering
spelling doaj-art-a9cc9813b28649d5b8f9aef75fc1097d2025-02-02T05:27:16ZengElsevierCase Studies in Thermal Engineering2214-157X2025-02-0166105725Applying the carbon materials in TSVs array for enhancing heat transfer performance of three-dimensional integrated circuitsPeng Xu0Huan Huang1Songjie Zhao2Xiushan Liu3Fa Zou4Chao Li5Jun Ai6Hui Liu7School of Electronics and Information, Guangdong Polytechnic Normal University, Guangzhou, 510665, ChinaSchool of Electronics and Information, Guangdong Polytechnic Normal University, Guangzhou, 510665, ChinaSchool of Electronics and Information, Guangdong Polytechnic Normal University, Guangzhou, 510665, ChinaAssets and Laboratory Management Office, Guangdong Polytechnic Normal University, Guangzhou, 510665, ChinaSchool of Electronics and Information Engineering, South China Normal University, Foshan, 528225, ChinaSchool of Electronics and Information, Guangdong Polytechnic Normal University, Guangzhou, 510665, ChinaGuangzhou Heron Intelligent Equipment Company Limited, Guangzhou, 510990, ChinaSchool of Electronics and Information, Guangdong Polytechnic Normal University, Guangzhou, 510665, China; Corresponding author.This paper proposed the carbon materials (including MLGNR, MWCNT and SWCNT) to replace the traditional Cu as the filler of through silicon via (TSV) for enhancing heat transfer performance of three-dimensional integrated circuits (3-D ICs), meanwhile the corresponding mathematical model is established to quickly obtain steady-state temperature of each die layer. The results indicated that the steady-state temperature of 3-D ICs with inserted MLGNR, MWCNT and SWCNT based TSVs array are reduced by 23.315 %, 29.043 % and 38.007 % respectively, as compared with Cu as the filler of TSV. Moreover, it is manifested that the heat transfer performance of 3-D ICs can be further improved by increasing the number and radius of TSV. The corresponding steady-state temperature of the scheme of 5 × 6 TSVs array is 10.415 % lower than that of the scheme of 4 × 4 TSVs array, in the meantime the steady-state temperature can be reduced by 16.016 % when the radius of TSV increases from 1.5 μm to 2.5 μm. Furthermore, it is demonstrated that the processor runtime and memory footprint of our proposed model are 46.938 and 6.771 times lower than COMSOL simulation model, and the maximum error between them is not exceeding 3 %.http://www.sciencedirect.com/science/article/pii/S2214157X240175683-D ICsTSVs arrayCarbon materialsHeat transfer performance
spellingShingle Peng Xu
Huan Huang
Songjie Zhao
Xiushan Liu
Fa Zou
Chao Li
Jun Ai
Hui Liu
Applying the carbon materials in TSVs array for enhancing heat transfer performance of three-dimensional integrated circuits
Case Studies in Thermal Engineering
3-D ICs
TSVs array
Carbon materials
Heat transfer performance
title Applying the carbon materials in TSVs array for enhancing heat transfer performance of three-dimensional integrated circuits
title_full Applying the carbon materials in TSVs array for enhancing heat transfer performance of three-dimensional integrated circuits
title_fullStr Applying the carbon materials in TSVs array for enhancing heat transfer performance of three-dimensional integrated circuits
title_full_unstemmed Applying the carbon materials in TSVs array for enhancing heat transfer performance of three-dimensional integrated circuits
title_short Applying the carbon materials in TSVs array for enhancing heat transfer performance of three-dimensional integrated circuits
title_sort applying the carbon materials in tsvs array for enhancing heat transfer performance of three dimensional integrated circuits
topic 3-D ICs
TSVs array
Carbon materials
Heat transfer performance
url http://www.sciencedirect.com/science/article/pii/S2214157X24017568
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