Wang, J. L., Chen, Y. Q., Feng, J. T., Xu, X. B., En, Y. F., Hou, B., . . . Geng, K. W. Trap Analysis Based on Low-Frequency Noise for SiC Power MOSFETs Under Repetitive Short-Circuit Stress. IEEE.
Chicago Style (17th ed.) CitationWang, J. L., et al. Trap Analysis Based on Low-Frequency Noise for SiC Power MOSFETs Under Repetitive Short-Circuit Stress. IEEE.
MLA (9th ed.) CitationWang, J. L., et al. Trap Analysis Based on Low-Frequency Noise for SiC Power MOSFETs Under Repetitive Short-Circuit Stress. IEEE.
Warning: These citations may not always be 100% accurate.