Realizing depth measurement and edge detection based on a single metasurface

How to simultaneously obtain the depth, edge, and other light information of the scene to accurately perceive the physical world is an important issue for imaging systems. However, such tasks usually require bulky optical components and active illumination methods. Here, we design and experimentally...

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Main Authors: Yang Siwen, Wei Qunshuo, Zhao Ruizhe, Li Xin, Zhang Xue, Li Yao, Li Junjie, Jing Xiaoli, Li Xiaowei, Wang Yongtian, Huang Lingling
Format: Article
Language:English
Published: De Gruyter 2023-07-01
Series:Nanophotonics
Subjects:
Online Access:https://doi.org/10.1515/nanoph-2023-0308
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author Yang Siwen
Wei Qunshuo
Zhao Ruizhe
Li Xin
Zhang Xue
Li Yao
Li Junjie
Jing Xiaoli
Li Xiaowei
Wang Yongtian
Huang Lingling
author_facet Yang Siwen
Wei Qunshuo
Zhao Ruizhe
Li Xin
Zhang Xue
Li Yao
Li Junjie
Jing Xiaoli
Li Xiaowei
Wang Yongtian
Huang Lingling
author_sort Yang Siwen
collection DOAJ
description How to simultaneously obtain the depth, edge, and other light information of the scene to accurately perceive the physical world is an important issue for imaging systems. However, such tasks usually require bulky optical components and active illumination methods. Here, we design and experimentally validate a single geometric metasurface that can achieve depth measurement or edge detection under incoherent or coherent light respectively. Double helix point source function is utilized, and three verification experiments are carried out, including double-helix beam calibration, 2D object and 3D object detection, respectively. Additionally, two-dimensional edge detection can also be achieved. This compact imaging system can enable new applications in various fields, from machine vision to microscopy.
format Article
id doaj-art-a99d49e67c8341fda76a05585e6da09c
institution OA Journals
issn 2192-8614
language English
publishDate 2023-07-01
publisher De Gruyter
record_format Article
series Nanophotonics
spelling doaj-art-a99d49e67c8341fda76a05585e6da09c2025-08-20T02:23:36ZengDe GruyterNanophotonics2192-86142023-07-0112163385339310.1515/nanoph-2023-0308Realizing depth measurement and edge detection based on a single metasurfaceYang Siwen0Wei Qunshuo1Zhao Ruizhe2Li Xin3Zhang Xue4Li Yao5Li Junjie6Jing Xiaoli7Li Xiaowei8Wang Yongtian9Huang Lingling10Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, ChinaBeijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, ChinaBeijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, ChinaBeijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, ChinaBeijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, ChinaBeijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, ChinaBeijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, ChinaBeijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, ChinaLaser Micro/Nano-Fabrication Laboratory, School of Mechanical Engineering, Beijing Institute of Technology, Beijing, 100081, ChinaBeijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, ChinaBeijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing, 100081, ChinaHow to simultaneously obtain the depth, edge, and other light information of the scene to accurately perceive the physical world is an important issue for imaging systems. However, such tasks usually require bulky optical components and active illumination methods. Here, we design and experimentally validate a single geometric metasurface that can achieve depth measurement or edge detection under incoherent or coherent light respectively. Double helix point source function is utilized, and three verification experiments are carried out, including double-helix beam calibration, 2D object and 3D object detection, respectively. Additionally, two-dimensional edge detection can also be achieved. This compact imaging system can enable new applications in various fields, from machine vision to microscopy.https://doi.org/10.1515/nanoph-2023-0308depth measurementdouble-helix beamedge detectionmetasurface
spellingShingle Yang Siwen
Wei Qunshuo
Zhao Ruizhe
Li Xin
Zhang Xue
Li Yao
Li Junjie
Jing Xiaoli
Li Xiaowei
Wang Yongtian
Huang Lingling
Realizing depth measurement and edge detection based on a single metasurface
Nanophotonics
depth measurement
double-helix beam
edge detection
metasurface
title Realizing depth measurement and edge detection based on a single metasurface
title_full Realizing depth measurement and edge detection based on a single metasurface
title_fullStr Realizing depth measurement and edge detection based on a single metasurface
title_full_unstemmed Realizing depth measurement and edge detection based on a single metasurface
title_short Realizing depth measurement and edge detection based on a single metasurface
title_sort realizing depth measurement and edge detection based on a single metasurface
topic depth measurement
double-helix beam
edge detection
metasurface
url https://doi.org/10.1515/nanoph-2023-0308
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