High-throughput screening and machine learning classification of van der Waals dielectrics for 2D nanoelectronics
Abstract Van der Waals (vdW) dielectrics are promising for enhancing the performance of nanoscale field-effect transistors (FETs) based on two-dimensional (2D) semiconductors due to their clean interfaces. Ideal vdW dielectrics for 2D FETs require high dielectric constants and proper band alignment...
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| Main Authors: | Yuhui Li, Guolin Wan, Yongqian Zhu, Jingyu Yang, Yan-Fang Zhang, Jinbo Pan, Shixuan Du |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2024-11-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-024-53864-4 |
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