Synthesis and Nanoscale Characterization of LiNbO3 Thin Films Deposited on Al2O3 Substrate by RF Magnetron Sputtering under Electric Field

LiNbO3 thin films were deposited on Al2O3 substrates by RF-magnetron sputtering with in-situ electric field to study the self-polarization effect. The films have been characterized crystallographically by x-ray diffraction, and morphologically by atomic force microscopy. The films contain crystallit...

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Main Authors: R.N. Zhukov, D.A. Kiselev, K.D. Shcherbachev, M.I. Voronova, S.V. Ksenich, I.V. Kubasov, A.A. Temirov, N.G. Timushkin, M.V. Chichkov, A.S. Bykov, M.D. Malinkovich, Yu.N. Parkhomenko
Format: Article
Language:English
Published: Sumy State University 2016-11-01
Series:Журнал нано- та електронної фізики
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Online Access:http://jnep.sumdu.edu.ua/download/numbers/2016/4/articles/jnep_2016_V8_04025.pdf
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author R.N. Zhukov
D.A. Kiselev
K.D. Shcherbachev
M.I. Voronova
S.V. Ksenich
I.V. Kubasov
A.A. Temirov
N.G. Timushkin
M.V. Chichkov
A.S. Bykov
M.D. Malinkovich
Yu.N. Parkhomenko
author_facet R.N. Zhukov
D.A. Kiselev
K.D. Shcherbachev
M.I. Voronova
S.V. Ksenich
I.V. Kubasov
A.A. Temirov
N.G. Timushkin
M.V. Chichkov
A.S. Bykov
M.D. Malinkovich
Yu.N. Parkhomenko
author_sort R.N. Zhukov
collection DOAJ
description LiNbO3 thin films were deposited on Al2O3 substrates by RF-magnetron sputtering with in-situ electric field to study the self-polarization effect. The films have been characterized crystallographically by x-ray diffraction, and morphologically by atomic force microscopy. The films contain crystallites of LiNbO3 with preferable orientation [012] along the normal to the Al2O3 substrate surface (012). Piezoresponse force microscopy was used to study vertical and lateral polarization direction in LiNbO3 thin films. The analysis of the histograms of vertical piezoresponse images allowed to reveal self-polarization effect in films. The local piezoelectric hysteresis performed on the nanometer scale indicates switching behavior of polarization for LiNbO3 thin film.
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institution DOAJ
issn 2077-6772
language English
publishDate 2016-11-01
publisher Sumy State University
record_format Article
series Журнал нано- та електронної фізики
spelling doaj-art-a8797b3f1cc94d39900a394369339cb22025-08-20T03:18:49ZengSumy State UniversityЖурнал нано- та електронної фізики2077-67722016-11-018404025-104025-410.21272/jnep.8(4(1)).04025Synthesis and Nanoscale Characterization of LiNbO3 Thin Films Deposited on Al2O3 Substrate by RF Magnetron Sputtering under Electric FieldR.N. Zhukov0D.A. Kiselev1K.D. Shcherbachev2M.I. Voronova3S.V. Ksenich4I.V. Kubasov5A.A. Temirov6N.G. Timushkin7M.V. Chichkov8A.S. Bykov9M.D. Malinkovich10Yu.N. Parkhomenko11National University of Science and Technology "MISiS", 4, Leninskiy pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy pr., 119049 Moscow, Russian FederationLiNbO3 thin films were deposited on Al2O3 substrates by RF-magnetron sputtering with in-situ electric field to study the self-polarization effect. The films have been characterized crystallographically by x-ray diffraction, and morphologically by atomic force microscopy. The films contain crystallites of LiNbO3 with preferable orientation [012] along the normal to the Al2O3 substrate surface (012). Piezoresponse force microscopy was used to study vertical and lateral polarization direction in LiNbO3 thin films. The analysis of the histograms of vertical piezoresponse images allowed to reveal self-polarization effect in films. The local piezoelectric hysteresis performed on the nanometer scale indicates switching behavior of polarization for LiNbO3 thin film.http://jnep.sumdu.edu.ua/download/numbers/2016/4/articles/jnep_2016_V8_04025.pdfLithium niobateRf-magnetron sputteringSelf-polarizationPiezoresponse force microscop
spellingShingle R.N. Zhukov
D.A. Kiselev
K.D. Shcherbachev
M.I. Voronova
S.V. Ksenich
I.V. Kubasov
A.A. Temirov
N.G. Timushkin
M.V. Chichkov
A.S. Bykov
M.D. Malinkovich
Yu.N. Parkhomenko
Synthesis and Nanoscale Characterization of LiNbO3 Thin Films Deposited on Al2O3 Substrate by RF Magnetron Sputtering under Electric Field
Журнал нано- та електронної фізики
Lithium niobate
Rf-magnetron sputtering
Self-polarization
Piezoresponse force microscop
title Synthesis and Nanoscale Characterization of LiNbO3 Thin Films Deposited on Al2O3 Substrate by RF Magnetron Sputtering under Electric Field
title_full Synthesis and Nanoscale Characterization of LiNbO3 Thin Films Deposited on Al2O3 Substrate by RF Magnetron Sputtering under Electric Field
title_fullStr Synthesis and Nanoscale Characterization of LiNbO3 Thin Films Deposited on Al2O3 Substrate by RF Magnetron Sputtering under Electric Field
title_full_unstemmed Synthesis and Nanoscale Characterization of LiNbO3 Thin Films Deposited on Al2O3 Substrate by RF Magnetron Sputtering under Electric Field
title_short Synthesis and Nanoscale Characterization of LiNbO3 Thin Films Deposited on Al2O3 Substrate by RF Magnetron Sputtering under Electric Field
title_sort synthesis and nanoscale characterization of linbo3 thin films deposited on al2o3 substrate by rf magnetron sputtering under electric field
topic Lithium niobate
Rf-magnetron sputtering
Self-polarization
Piezoresponse force microscop
url http://jnep.sumdu.edu.ua/download/numbers/2016/4/articles/jnep_2016_V8_04025.pdf
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