Calibration of Electron Microscopes Through Deep Learning and Bayesian Optimization

Calibration of Electron Microscopes Through Deep Learning and Bayesian Optimization

Electron microscopes can create images at atomic resolution, enabling key developments across many scientific fields. To obtain high-resolution images, the inherent imperfections in the electromagnetic lenses have to be overcome by frequent and extensive calibration. Currently, this calibration is t...

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Bibliographic Details
Main Authors: Jilles S. van Hulst, Roy A. C. van Zuijlen, Narges Javaheri, Maurits Diephuis, Duarte J. Antunes, W. P. M. H. Heemels
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Applications
Bayesian optimization
deep learning
electron microscopy
Gaussian processes
machine learning
Online Access:https://ieeexplore.ieee.org/document/11107396/
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