Speckle-Based Transmission and Dark-Field Imaging for Material Analysis with a Laboratory X-Ray Source

Multimodal imaging is valuable because it can provide additional information beyond that obtained from a conventional bright-field (BF) image and can be implemented with a widely available device. In this paper, we investigate the implementation of speckle-based transmission (T) and dark-field (DF)...

Full description

Saved in:
Bibliographic Details
Main Authors: Diego Rosich, Margarita Chevalier, Tatiana Alieva
Format: Article
Language:English
Published: MDPI AG 2025-04-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/25/8/2581
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1849714262674505728
author Diego Rosich
Margarita Chevalier
Tatiana Alieva
author_facet Diego Rosich
Margarita Chevalier
Tatiana Alieva
author_sort Diego Rosich
collection DOAJ
description Multimodal imaging is valuable because it can provide additional information beyond that obtained from a conventional bright-field (BF) image and can be implemented with a widely available device. In this paper, we investigate the implementation of speckle-based transmission (T) and dark-field (DF) imaging in a laboratory X-ray setup to confirm its usefulness for material analysis. Three methods for recovering T and DF images were applied to a sample composed of six materials: plastic, nylon, cardboard, cork, expanded polystyrene and foam with different absorption and scattering properties. Contrast-to-noise ratio (CNR) and linear attenuation, absorption and diffusion coefficients obtained from BF, T and DF images are studied for two object-to-detector distances (ODDs). Two analysis windows are evaluated to determine the impact of noise on the image contrast of T and DF images and the ability to retrieve material characteristics. The unified modulated pattern analysis method proves to be the most reliable among the three studied speckle-based methods. The results showed that the CNR of T and DF images increases with larger analysis windows, while linear absorption and diffusion coefficients remain constant. The CNR of T images decreases with increasing ODD due to noise, whereas the CNR of DF images exhibits more complex behaviour, due to the material-dependent reduction in DF signal with increasing ODD. The experimental results on the ODD dependence of T and DF signals are consistent with recently reported numerical simulation results of these signals. The absorption coefficients derived from T images are largely independent of the ODD and the speckle-based method used, making them a universal parameter for material discrimination. In contrast, the linear diffusion coefficients vary with the ODD, limiting their applicability to specific experimental configurations despite their notable advantages in distinguishing materials. These findings highlight that T and DF images obtained from a laboratory X-ray setup offer complementary insights, enhancing their value for material analysis.
format Article
id doaj-art-a4d66088ad364c3aa80ff8d930ee876b
institution DOAJ
issn 1424-8220
language English
publishDate 2025-04-01
publisher MDPI AG
record_format Article
series Sensors
spelling doaj-art-a4d66088ad364c3aa80ff8d930ee876b2025-08-20T03:13:45ZengMDPI AGSensors1424-82202025-04-01258258110.3390/s25082581Speckle-Based Transmission and Dark-Field Imaging for Material Analysis with a Laboratory X-Ray SourceDiego Rosich0Margarita Chevalier1Tatiana Alieva2Physics Institute of Cantabria (IFCA-CSIC-UC), Av. de los Castros s/n, 39005 Santander, SpainDepartment of Radiology, Physiotherapy and Rehabilitation, Faculty of Medicine, Complutense University of Madrid, Pl. de Ramón y Cajal s/n, 28040 Madrid, SpainDepartment of Optics, Faculty of Physics, Complutense University of Madrid, Pl. de las Ciencias 1, 28040 Madrid, SpainMultimodal imaging is valuable because it can provide additional information beyond that obtained from a conventional bright-field (BF) image and can be implemented with a widely available device. In this paper, we investigate the implementation of speckle-based transmission (T) and dark-field (DF) imaging in a laboratory X-ray setup to confirm its usefulness for material analysis. Three methods for recovering T and DF images were applied to a sample composed of six materials: plastic, nylon, cardboard, cork, expanded polystyrene and foam with different absorption and scattering properties. Contrast-to-noise ratio (CNR) and linear attenuation, absorption and diffusion coefficients obtained from BF, T and DF images are studied for two object-to-detector distances (ODDs). Two analysis windows are evaluated to determine the impact of noise on the image contrast of T and DF images and the ability to retrieve material characteristics. The unified modulated pattern analysis method proves to be the most reliable among the three studied speckle-based methods. The results showed that the CNR of T and DF images increases with larger analysis windows, while linear absorption and diffusion coefficients remain constant. The CNR of T images decreases with increasing ODD due to noise, whereas the CNR of DF images exhibits more complex behaviour, due to the material-dependent reduction in DF signal with increasing ODD. The experimental results on the ODD dependence of T and DF signals are consistent with recently reported numerical simulation results of these signals. The absorption coefficients derived from T images are largely independent of the ODD and the speckle-based method used, making them a universal parameter for material discrimination. In contrast, the linear diffusion coefficients vary with the ODD, limiting their applicability to specific experimental configurations despite their notable advantages in distinguishing materials. These findings highlight that T and DF images obtained from a laboratory X-ray setup offer complementary insights, enhancing their value for material analysis.https://www.mdpi.com/1424-8220/25/8/2581X-ray speckle-based imaginglaboratory sourcedark-field imagingmultimodal X-ray imagingmaterial analysis
spellingShingle Diego Rosich
Margarita Chevalier
Tatiana Alieva
Speckle-Based Transmission and Dark-Field Imaging for Material Analysis with a Laboratory X-Ray Source
Sensors
X-ray speckle-based imaging
laboratory source
dark-field imaging
multimodal X-ray imaging
material analysis
title Speckle-Based Transmission and Dark-Field Imaging for Material Analysis with a Laboratory X-Ray Source
title_full Speckle-Based Transmission and Dark-Field Imaging for Material Analysis with a Laboratory X-Ray Source
title_fullStr Speckle-Based Transmission and Dark-Field Imaging for Material Analysis with a Laboratory X-Ray Source
title_full_unstemmed Speckle-Based Transmission and Dark-Field Imaging for Material Analysis with a Laboratory X-Ray Source
title_short Speckle-Based Transmission and Dark-Field Imaging for Material Analysis with a Laboratory X-Ray Source
title_sort speckle based transmission and dark field imaging for material analysis with a laboratory x ray source
topic X-ray speckle-based imaging
laboratory source
dark-field imaging
multimodal X-ray imaging
material analysis
url https://www.mdpi.com/1424-8220/25/8/2581
work_keys_str_mv AT diegorosich specklebasedtransmissionanddarkfieldimagingformaterialanalysiswithalaboratoryxraysource
AT margaritachevalier specklebasedtransmissionanddarkfieldimagingformaterialanalysiswithalaboratoryxraysource
AT tatianaalieva specklebasedtransmissionanddarkfieldimagingformaterialanalysiswithalaboratoryxraysource