MEASURING CIRCUIT FOR CONVERSION PARAMETERS OF THE MIS-STRUCTURE
Background. The information value of the process of measuring the parameters of the MIS-structure is determined to the maximum extent by the configuration of the measuring circuit, which converts the parameters of the MISstructure as a passive object into active values. Materials and methods. It is...
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| Format: | Article |
| Language: | English |
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Penza State University Publishing House
2025-06-01
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| Series: | Измерение, мониторинг, управление, контроль |
| Subjects: | |
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