Rapid eigenpatch utility classifier for image denoising
Abstract Under low-illumination conditions, images inevitably contain both Poisson and Gaussian noise. In electron microscopy, there is the added complication whereby increasing the dose-rate, to improve signal-to-noise, damages the specimen being imaged, making certain materials being impossible to...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2025-05-01
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| Series: | Scientific Reports |
| Online Access: | https://doi.org/10.1038/s41598-025-96859-x |
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