Study of the Influence of the Voltage Regulator Integrated Circuit Topology on its Radiation Hardness

Study of the Influence of the Voltage Regulator Integrated Circuit Topology on its Radiation Hardness

Method of recording responses to radiation exposure is considered using the X-ray complex RIK-0401 and it is shown that for linear voltage regulators integrated circuits it allows diagnosing presence of changes in their topology. Four types of integrated circuits (ICs) of IS-LS1-1.8V type have been...

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Bibliographic Details
Main Authors: Е. A. Кulchenkov, A. A. Demidov, S. B. Rybalka
Format: Article
Language:English
Published: Belarusian National Technical University 2025-03-01
Series:Приборы и методы измерений
Subjects:
voltage regulator
total ionizing dose effects
ionizing radiation
radiation hardness
Online Access:https://pimi.bntu.by/jour/article/view/929
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