SEM Deep Learning Multiclass Noise Level Classification With Data Augmentation
Scanning electron microscopy (SEM) plays an important role in providing high-resolution imaging in various fields, including industrial chip manufacturing, materials science, and nanoscale biology. However, high-resolution imaging often compromises image quality due to noise, such as Gaussian noise,...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10993397/ |
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