Multi-beam multi-slice X-ray ptychography
Abstract X-ray ptychography provides the highest resolution non-destructive imaging at synchrotron radiation facilities, and the efficiency of this method is crucial for coping with limited experimental time. Recent advancements in multi-beam ptychography have enabled larger fields of view, but spat...
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| Format: | Article |
| Language: | English |
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Nature Portfolio
2025-03-01
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| Series: | Scientific Reports |
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| Online Access: | https://doi.org/10.1038/s41598-025-93757-0 |
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| author | Mattias Åstrand Ulrich Vogt Runqing Yang Pablo Villanueva Perez Tang Li Mikhail Lyubomirskiy Maik Kahnt |
| author_facet | Mattias Åstrand Ulrich Vogt Runqing Yang Pablo Villanueva Perez Tang Li Mikhail Lyubomirskiy Maik Kahnt |
| author_sort | Mattias Åstrand |
| collection | DOAJ |
| description | Abstract X-ray ptychography provides the highest resolution non-destructive imaging at synchrotron radiation facilities, and the efficiency of this method is crucial for coping with limited experimental time. Recent advancements in multi-beam ptychography have enabled larger fields of view, but spatial resolution for large 3D samples remains constrained by their thickness, requiring consideration of multiple scattering events. Although this challenge has been addressed using multi-slicing in conventional ptychography, the integration of multi-slicing with multi-beam ptychography has not yet been explored. Here we present the first successful combination of these two methods, enabling high-resolution imaging of nanofeatures at depths comparable to the lateral dimensions that can be addressed by state-of-the-art multi-beam ptychography. Our approach is robust, reproducible across different beamlines, and ready for broader application. It marks a significant advancement in the field, establishing a new foundation for high-resolution 3D imaging of larger, thicker samples. |
| format | Article |
| id | doaj-art-a1555963dff5413f997ce891bd7f3e38 |
| institution | Kabale University |
| issn | 2045-2322 |
| language | English |
| publishDate | 2025-03-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Scientific Reports |
| spelling | doaj-art-a1555963dff5413f997ce891bd7f3e382025-08-20T03:41:47ZengNature PortfolioScientific Reports2045-23222025-03-011511710.1038/s41598-025-93757-0Multi-beam multi-slice X-ray ptychographyMattias Åstrand0Ulrich Vogt1Runqing Yang2Pablo Villanueva Perez3Tang Li4Mikhail Lyubomirskiy5Maik Kahnt6KTH Royal Institute of Technology, Department of Applied Physics, Bio-Opto-Nano Physics, Albanova University CenterKTH Royal Institute of Technology, Department of Applied Physics, Bio-Opto-Nano Physics, Albanova University CenterMAX IV Laboratory, Lund UniversityDepartment of Physics, Synchrotron Radiation Research, Lund UniversityCenter for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESYMAX IV Laboratory, Lund UniversityMAX IV Laboratory, Lund UniversityAbstract X-ray ptychography provides the highest resolution non-destructive imaging at synchrotron radiation facilities, and the efficiency of this method is crucial for coping with limited experimental time. Recent advancements in multi-beam ptychography have enabled larger fields of view, but spatial resolution for large 3D samples remains constrained by their thickness, requiring consideration of multiple scattering events. Although this challenge has been addressed using multi-slicing in conventional ptychography, the integration of multi-slicing with multi-beam ptychography has not yet been explored. Here we present the first successful combination of these two methods, enabling high-resolution imaging of nanofeatures at depths comparable to the lateral dimensions that can be addressed by state-of-the-art multi-beam ptychography. Our approach is robust, reproducible across different beamlines, and ready for broader application. It marks a significant advancement in the field, establishing a new foundation for high-resolution 3D imaging of larger, thicker samples.https://doi.org/10.1038/s41598-025-93757-0PtychographyMulti-beamMulti-slice |
| spellingShingle | Mattias Åstrand Ulrich Vogt Runqing Yang Pablo Villanueva Perez Tang Li Mikhail Lyubomirskiy Maik Kahnt Multi-beam multi-slice X-ray ptychography Scientific Reports Ptychography Multi-beam Multi-slice |
| title | Multi-beam multi-slice X-ray ptychography |
| title_full | Multi-beam multi-slice X-ray ptychography |
| title_fullStr | Multi-beam multi-slice X-ray ptychography |
| title_full_unstemmed | Multi-beam multi-slice X-ray ptychography |
| title_short | Multi-beam multi-slice X-ray ptychography |
| title_sort | multi beam multi slice x ray ptychography |
| topic | Ptychography Multi-beam Multi-slice |
| url | https://doi.org/10.1038/s41598-025-93757-0 |
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