Laser-driven proton sources for efficient radiation testing
Abstract Several fields such as particle physics, space exploration, and high-energy physics, use Commercial Off-The-Shelf (COTS) electronic components in a high-radiation operative environment. These operating conditions can cause significant damage to electronic circuits, affecting their operation...
Saved in:
| Main Authors: | , , , , , , , , , , , , , , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2025-07-01
|
| Series: | Scientific Reports |
| Subjects: | |
| Online Access: | https://doi.org/10.1038/s41598-025-05682-x |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1849763360988463104 |
|---|---|
| author | Beatrice D’Orsi Corrado Altomare Alessandro Ampollini Maria Denise Astorino Giulia Bazzano Elias Catrix Alessia Cemmi Andrea Colangeli Ilaria Di Sarcina Daniele Salvatore Lazzaro Ronan Lelièvre Stefano Loreti Sylvain Fourmaux Julien Fuchs Paolo Nenzi Guglielmo Pagano Fabio Panza Concetta Ronsivalle Jessica Scifo Simon Vallières Patrizio Antici |
| author_facet | Beatrice D’Orsi Corrado Altomare Alessandro Ampollini Maria Denise Astorino Giulia Bazzano Elias Catrix Alessia Cemmi Andrea Colangeli Ilaria Di Sarcina Daniele Salvatore Lazzaro Ronan Lelièvre Stefano Loreti Sylvain Fourmaux Julien Fuchs Paolo Nenzi Guglielmo Pagano Fabio Panza Concetta Ronsivalle Jessica Scifo Simon Vallières Patrizio Antici |
| author_sort | Beatrice D’Orsi |
| collection | DOAJ |
| description | Abstract Several fields such as particle physics, space exploration, and high-energy physics, use Commercial Off-The-Shelf (COTS) electronic components in a high-radiation operative environment. These operating conditions can cause significant damage to electronic circuits, affecting their operational features and thus the reliability of the entire facility. Qualifying and characterizing these components against radiation is essential to ensure their proper functioning in harsh conditions. This study investigates the effect of stress-testing electronic components used in high-radiation environments with various types of radiation sources. The components were exposed to gamma rays, laser-driven protons, conventionally accelerated protons, and neutrons, analyzing the devices parameters after different irradiation conditions. The results indicate significant degradation in electrical performance due to radiation-induced defects and significant variations of the effects at same dose delivery. We show that laser-driven proton irradiation achieves equivalent stress-testing with doses two orders of magnitude lower and much quicker than other radiation sources, demonstrating a much higher stress-testing efficiency. |
| format | Article |
| id | doaj-art-a01d62bce52b41bcab2a05394f4c13f0 |
| institution | DOAJ |
| issn | 2045-2322 |
| language | English |
| publishDate | 2025-07-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Scientific Reports |
| spelling | doaj-art-a01d62bce52b41bcab2a05394f4c13f02025-08-20T03:05:26ZengNature PortfolioScientific Reports2045-23222025-07-0115111110.1038/s41598-025-05682-xLaser-driven proton sources for efficient radiation testingBeatrice D’Orsi0Corrado Altomare1Alessandro Ampollini2Maria Denise Astorino3Giulia Bazzano4Elias Catrix5Alessia Cemmi6Andrea Colangeli7Ilaria Di Sarcina8Daniele Salvatore Lazzaro9Ronan Lelièvre10Stefano Loreti11Sylvain Fourmaux12Julien Fuchs13Paolo Nenzi14Guglielmo Pagano15Fabio Panza16Concetta Ronsivalle17Jessica Scifo18Simon Vallières19Patrizio Antici20INRS, EMT VarennesIMT SrlENEA Nuclear DepartmentENEA Nuclear DepartmentENEA Nuclear DepartmentINRS, EMT VarennesENEA Nuclear DepartmentENEA Nuclear DepartmentENEA Nuclear DepartmentIMT SrlLULI, LULI - CNRS, CEA, UPMC Univ Paris 06: Sorbonne Université, Ecole Polytechnique, Institut Polytechnique de ParisENEA Nuclear DepartmentINRS, EMT VarennesLULI, LULI - CNRS, CEA, UPMC Univ Paris 06: Sorbonne Université, Ecole Polytechnique, Institut Polytechnique de ParisENEA Nuclear DepartmentENEA Nuclear DepartmentENEA Nuclear DepartmentENEA Nuclear DepartmentENEA Nuclear DepartmentINRS, EMT VarennesINRS, EMT VarennesAbstract Several fields such as particle physics, space exploration, and high-energy physics, use Commercial Off-The-Shelf (COTS) electronic components in a high-radiation operative environment. These operating conditions can cause significant damage to electronic circuits, affecting their operational features and thus the reliability of the entire facility. Qualifying and characterizing these components against radiation is essential to ensure their proper functioning in harsh conditions. This study investigates the effect of stress-testing electronic components used in high-radiation environments with various types of radiation sources. The components were exposed to gamma rays, laser-driven protons, conventionally accelerated protons, and neutrons, analyzing the devices parameters after different irradiation conditions. The results indicate significant degradation in electrical performance due to radiation-induced defects and significant variations of the effects at same dose delivery. We show that laser-driven proton irradiation achieves equivalent stress-testing with doses two orders of magnitude lower and much quicker than other radiation sources, demonstrating a much higher stress-testing efficiency.https://doi.org/10.1038/s41598-025-05682-xRadiation hardnessTransistorsGamma radiationLaser-plasma accelerationProtonsNeutrons |
| spellingShingle | Beatrice D’Orsi Corrado Altomare Alessandro Ampollini Maria Denise Astorino Giulia Bazzano Elias Catrix Alessia Cemmi Andrea Colangeli Ilaria Di Sarcina Daniele Salvatore Lazzaro Ronan Lelièvre Stefano Loreti Sylvain Fourmaux Julien Fuchs Paolo Nenzi Guglielmo Pagano Fabio Panza Concetta Ronsivalle Jessica Scifo Simon Vallières Patrizio Antici Laser-driven proton sources for efficient radiation testing Scientific Reports Radiation hardness Transistors Gamma radiation Laser-plasma acceleration Protons Neutrons |
| title | Laser-driven proton sources for efficient radiation testing |
| title_full | Laser-driven proton sources for efficient radiation testing |
| title_fullStr | Laser-driven proton sources for efficient radiation testing |
| title_full_unstemmed | Laser-driven proton sources for efficient radiation testing |
| title_short | Laser-driven proton sources for efficient radiation testing |
| title_sort | laser driven proton sources for efficient radiation testing |
| topic | Radiation hardness Transistors Gamma radiation Laser-plasma acceleration Protons Neutrons |
| url | https://doi.org/10.1038/s41598-025-05682-x |
| work_keys_str_mv | AT beatricedorsi laserdrivenprotonsourcesforefficientradiationtesting AT corradoaltomare laserdrivenprotonsourcesforefficientradiationtesting AT alessandroampollini laserdrivenprotonsourcesforefficientradiationtesting AT mariadeniseastorino laserdrivenprotonsourcesforefficientradiationtesting AT giuliabazzano laserdrivenprotonsourcesforefficientradiationtesting AT eliascatrix laserdrivenprotonsourcesforefficientradiationtesting AT alessiacemmi laserdrivenprotonsourcesforefficientradiationtesting AT andreacolangeli laserdrivenprotonsourcesforefficientradiationtesting AT ilariadisarcina laserdrivenprotonsourcesforefficientradiationtesting AT danielesalvatorelazzaro laserdrivenprotonsourcesforefficientradiationtesting AT ronanlelievre laserdrivenprotonsourcesforefficientradiationtesting AT stefanoloreti laserdrivenprotonsourcesforefficientradiationtesting AT sylvainfourmaux laserdrivenprotonsourcesforefficientradiationtesting AT julienfuchs laserdrivenprotonsourcesforefficientradiationtesting AT paolonenzi laserdrivenprotonsourcesforefficientradiationtesting AT guglielmopagano laserdrivenprotonsourcesforefficientradiationtesting AT fabiopanza laserdrivenprotonsourcesforefficientradiationtesting AT concettaronsivalle laserdrivenprotonsourcesforefficientradiationtesting AT jessicascifo laserdrivenprotonsourcesforefficientradiationtesting AT simonvallieres laserdrivenprotonsourcesforefficientradiationtesting AT patrizioantici laserdrivenprotonsourcesforefficientradiationtesting |