Leveraging Vision Foundation Model via PConv-Based Fine-Tuning with Automated Prompter for Defect Segmentation
In industrial scenarios, image segmentation is essential for accurately identifying defect regions. Recently, the emergence of foundation models driven by powerful computational resources and large-scale training data has brought about a paradigm shift in deep learning-based image segmentation. The...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-04-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/25/8/2417 |
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