Refractometric Sensing Using High-Order Diffraction Spots From Ordered Vertical Silicon Nanowire Arrays
We propose to use high-order diffraction spots from 2-D silicon nanowire (NW) arrays for refractive index sensing based on spatial changes in the diffractive spots position. The NW arrays act both as a refractive index sensor and as dispersive elements, eliminating the need for external spectrometer...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2016-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/7444133/ |
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