Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques
Abstract The performance of an X-ray grating interferometry system depends on the geometry and quality of the gratings. Fabrication of micrometer-pitch high-aspect-ratio gold gratings, which are essential for measuring small refraction angles at higher energies, is challenging. The two widely used t...
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| Format: | Article |
| Language: | English |
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Nature Portfolio
2025-04-01
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| Series: | Scientific Reports |
| Online Access: | https://doi.org/10.1038/s41598-025-98148-z |
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| author | Alexandre Pereira Simon Spindler Zhitian Shi Lucia Romano Michał Rawlik Federica Marone Daniel Josell Martin Stauber Marco Stampanoni |
| author_facet | Alexandre Pereira Simon Spindler Zhitian Shi Lucia Romano Michał Rawlik Federica Marone Daniel Josell Martin Stauber Marco Stampanoni |
| author_sort | Alexandre Pereira |
| collection | DOAJ |
| description | Abstract The performance of an X-ray grating interferometry system depends on the geometry and quality of the gratings. Fabrication of micrometer-pitch high-aspect-ratio gold gratings, which are essential for measuring small refraction angles at higher energies, is challenging. The two widely used technologies for manufacturing gratings are based on gold electroplating in polymeric or silicon templates. Here, gratings manufactured by both approaches were inspected using conventional microscopy, X-ray synchrotron radiography, and computed laminography to extract characteristic features of the gratings profile to be modeled accurately. These models were used in a wave-propagation simulation to predict the effects of the gratings’ geometry and defects on the quality of a Talbot-Lau interferometer in terms of visibility and absorption capabilities. The simulated outcomes of grating features produced with both techniques could eventually be observed and evaluated in a table-top Talbot-Lau-Interferometer. |
| format | Article |
| id | doaj-art-9f3975c709ff44ca8b177d6387ae1ceb |
| institution | OA Journals |
| issn | 2045-2322 |
| language | English |
| publishDate | 2025-04-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Scientific Reports |
| spelling | doaj-art-9f3975c709ff44ca8b177d6387ae1ceb2025-08-20T02:19:07ZengNature PortfolioScientific Reports2045-23222025-04-0115111310.1038/s41598-025-98148-zQuantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniquesAlexandre Pereira0Simon Spindler1Zhitian Shi2Lucia Romano3Michał Rawlik4Federica Marone5Daniel Josell6Martin Stauber7Marco Stampanoni8Institute for Biomedical Engineering, ETH Zürich and University of ZürichInstitute for Biomedical Engineering, ETH Zürich and University of ZürichInstitute for Biomedical Engineering, ETH Zürich and University of ZürichInstitute for Biomedical Engineering, ETH Zürich and University of ZürichInstitute for Biomedical Engineering, ETH Zürich and University of ZürichSwiss Light Source, Paul Scherrer InstituteMaterials Science and Engineering Division, NISTGratXrayInstitute for Biomedical Engineering, ETH Zürich and University of ZürichAbstract The performance of an X-ray grating interferometry system depends on the geometry and quality of the gratings. Fabrication of micrometer-pitch high-aspect-ratio gold gratings, which are essential for measuring small refraction angles at higher energies, is challenging. The two widely used technologies for manufacturing gratings are based on gold electroplating in polymeric or silicon templates. Here, gratings manufactured by both approaches were inspected using conventional microscopy, X-ray synchrotron radiography, and computed laminography to extract characteristic features of the gratings profile to be modeled accurately. These models were used in a wave-propagation simulation to predict the effects of the gratings’ geometry and defects on the quality of a Talbot-Lau interferometer in terms of visibility and absorption capabilities. The simulated outcomes of grating features produced with both techniques could eventually be observed and evaluated in a table-top Talbot-Lau-Interferometer.https://doi.org/10.1038/s41598-025-98148-z |
| spellingShingle | Alexandre Pereira Simon Spindler Zhitian Shi Lucia Romano Michał Rawlik Federica Marone Daniel Josell Martin Stauber Marco Stampanoni Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques Scientific Reports |
| title | Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques |
| title_full | Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques |
| title_fullStr | Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques |
| title_full_unstemmed | Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques |
| title_short | Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques |
| title_sort | quantifying grating defects in x ray talbot lau interferometry through a comparative study of two fabrication techniques |
| url | https://doi.org/10.1038/s41598-025-98148-z |
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