Research on High-Precision Measurement Technology of the Extinction Ratio Based on the Transparent Element Mueller Matrix

With the widespread application of optical technology in numerous fields, the polarization performance of transmissive optical components has become increasingly crucial. The extinction ratio, an important indicator for evaluating their polarization characteristics, holds great significance for its...

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Bibliographic Details
Main Authors: Ruiqi Xu, Mingpeng Hu, Xuedong Cao, Jiahui Ren
Format: Article
Language:English
Published: MDPI AG 2025-06-01
Series:Micromachines
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Online Access:https://www.mdpi.com/2072-666X/16/7/781
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Summary:With the widespread application of optical technology in numerous fields, the polarization performance of transmissive optical components has become increasingly crucial. The extinction ratio, an important indicator for evaluating their polarization characteristics, holds great significance for its precise detection. Aiming at the measurement of the extinction ratio of a transparent component, this study proposes a measurement method for solving the extinction ratio based on measuring the Mueller matrix of the transparent component. The purpose is to analyze the worst position of the extinction ratio of the transmissive component. The extinction ratio of the sample is obtained according to the phase retardation derived from the Stokes vector of the incident light and the Mueller matrix of the optical component, and a theoretical analysis and simulation of this method are carried out. The simulation results verify the feasibility of the theoretical derivation of this method. To further verify the accuracy of the measurement method, experimental verification is conducted. A standard transparent sample with a phase retardation of 13 nm is selected for actual measurement. The data of independent experiments on the transparent sample under different powers are analyzed, and the extinction ratio of the transparent sample is further obtained. When using this method, the relative error is less than 2%, indicating good accuracy.
ISSN:2072-666X