Radiation Pattern Measurement in the Planar Coordinate
A planar measurement approach is presented to obtain the radiation pattern, by which rotation operations can be removed or reduced for a source with narrow and divergent viewing angle, respectively. The Étendue conservation is applied to derive the intensity distribution relationship betw...
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| Format: | Article |
| Language: | English |
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IEEE
2019-01-01
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| Series: | IEEE Photonics Journal |
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| Online Access: | https://ieeexplore.ieee.org/document/8880472/ |
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| author | Chen Yang Yi-hao Wang Yi Wang Zhao Ding Jun Wen Li-Feng Bian |
| author_facet | Chen Yang Yi-hao Wang Yi Wang Zhao Ding Jun Wen Li-Feng Bian |
| author_sort | Chen Yang |
| collection | DOAJ |
| description | A planar measurement approach is presented to obtain the radiation pattern, by which rotation operations can be removed or reduced for a source with narrow and divergent viewing angle, respectively. The Étendue conservation is applied to derive the intensity distribution relationship between planar and spherical surfaces, which is further used for the radiation feature measurement on planar systems. As an indirect approach, sampling position distribution and measurement sensitivity is then discussed. Four application scenarios of the method are proposed and experimentally studied, including: 1D, 3D wireframe, pattern reconstruction for Monte Carlo ray-tracing planar data and 3D pattern estimation for luminaires. 1D radiation pattern obtained by classical goniophotometer method is employed as an evaluation standard, and experiments indicate that the results agree well between the two approaches. Therefore, the planar measurement can be applied as an alternative or supplementary method of the goniophotometer to test angle-dependent attributes of sources. |
| format | Article |
| id | doaj-art-9d7932fa63164bb6a8f14a31ddb620d1 |
| institution | Kabale University |
| issn | 1943-0655 |
| language | English |
| publishDate | 2019-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Photonics Journal |
| spelling | doaj-art-9d7932fa63164bb6a8f14a31ddb620d12025-08-20T03:32:46ZengIEEEIEEE Photonics Journal1943-06552019-01-0111611010.1109/JPHOT.2019.29491478880472Radiation Pattern Measurement in the Planar CoordinateChen Yang0https://orcid.org/0000-0001-5738-9641Yi-hao Wang1Yi Wang2Zhao Ding3Jun Wen4Li-Feng Bian5College of Big Data and Information Engineering, Guizhou Key Laboratory of Micro-Nano-Electronics and Software Technology, Engineering Center of the Ministry of Education of Semiconductor Power Device Reliability, Guizhou University, Guiyang, ChinaCollege of Big Data and Information Engineering, Guizhou Key Laboratory of Micro-Nano-Electronics and Software Technology, Engineering Center of the Ministry of Education of Semiconductor Power Device Reliability, Guizhou University, Guiyang, ChinaCollege of Big Data and Information Engineering, Guizhou Key Laboratory of Micro-Nano-Electronics and Software Technology, Engineering Center of the Ministry of Education of Semiconductor Power Device Reliability, Guizhou University, Guiyang, ChinaCollege of Big Data and Information Engineering, Guizhou Key Laboratory of Micro-Nano-Electronics and Software Technology, Engineering Center of the Ministry of Education of Semiconductor Power Device Reliability, Guizhou University, Guiyang, ChinaSchool of Computer and Electrical Information, Guangxi University, Nanning, ChinaKey Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, ChinaA planar measurement approach is presented to obtain the radiation pattern, by which rotation operations can be removed or reduced for a source with narrow and divergent viewing angle, respectively. The Étendue conservation is applied to derive the intensity distribution relationship between planar and spherical surfaces, which is further used for the radiation feature measurement on planar systems. As an indirect approach, sampling position distribution and measurement sensitivity is then discussed. Four application scenarios of the method are proposed and experimentally studied, including: 1D, 3D wireframe, pattern reconstruction for Monte Carlo ray-tracing planar data and 3D pattern estimation for luminaires. 1D radiation pattern obtained by classical goniophotometer method is employed as an evaluation standard, and experiments indicate that the results agree well between the two approaches. Therefore, the planar measurement can be applied as an alternative or supplementary method of the goniophotometer to test angle-dependent attributes of sources.https://ieeexplore.ieee.org/document/8880472/Radiation patternplanar measurementÉtendue conservation. |
| spellingShingle | Chen Yang Yi-hao Wang Yi Wang Zhao Ding Jun Wen Li-Feng Bian Radiation Pattern Measurement in the Planar Coordinate IEEE Photonics Journal Radiation pattern planar measurement Étendue conservation. |
| title | Radiation Pattern Measurement in the Planar Coordinate |
| title_full | Radiation Pattern Measurement in the Planar Coordinate |
| title_fullStr | Radiation Pattern Measurement in the Planar Coordinate |
| title_full_unstemmed | Radiation Pattern Measurement in the Planar Coordinate |
| title_short | Radiation Pattern Measurement in the Planar Coordinate |
| title_sort | radiation pattern measurement in the planar coordinate |
| topic | Radiation pattern planar measurement Étendue conservation. |
| url | https://ieeexplore.ieee.org/document/8880472/ |
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