Analysis of Erbium and Vanadium Diffusion in Porous Silicon Carbide

Experimental data on diffusion of erbium and vanadium in porous and nonporous silicon carbide at 1700 and 2200°C have been used for modelling diffusion in porous SiC. It is shown that the consideration of pore structure modification under annealing via vacancy redistribution allows for satisfactory...

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Main Authors: Marina G. Mynbaeva, Evgeny L. Pankratov, Evgeniy N. Mokhov, Karim D. Mynbaev
Format: Article
Language:English
Published: Wiley 2012-01-01
Series:Advances in Condensed Matter Physics
Online Access:http://dx.doi.org/10.1155/2012/439617
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author Marina G. Mynbaeva
Evgeny L. Pankratov
Evgeniy N. Mokhov
Karim D. Mynbaev
author_facet Marina G. Mynbaeva
Evgeny L. Pankratov
Evgeniy N. Mokhov
Karim D. Mynbaev
author_sort Marina G. Mynbaeva
collection DOAJ
description Experimental data on diffusion of erbium and vanadium in porous and nonporous silicon carbide at 1700 and 2200°C have been used for modelling diffusion in porous SiC. It is shown that the consideration of pore structure modification under annealing via vacancy redistribution allows for satisfactory description of dopant diffusion. As expected, important contribution to the diffusion in the porous medium is found to be made by the walls of the pores: in SiC, the vacancy surface diffusion coefficient on the walls appears to exceed that in the bulk of the material by an order of magnitude. When thermal treatment transforms pore channels into closed voids, pathways for accelerated diffusion cease to exist and diffusion rates in porous and nonporous SiC become similar.
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spelling doaj-art-9b262d59ce394769aaf2ad97f361a01c2025-08-20T03:36:57ZengWileyAdvances in Condensed Matter Physics1687-81081687-81242012-01-01201210.1155/2012/439617439617Analysis of Erbium and Vanadium Diffusion in Porous Silicon CarbideMarina G. Mynbaeva0Evgeny L. Pankratov1Evgeniy N. Mokhov2Karim D. Mynbaev3Ioffe Physical-Technical Institute of the Russian Academy of Sciences, 26 Polytechnicheskaya Street St., Petersburg 194021, RussiaMathematical Department, Faculty of Radiophysics, Nizhny Novgorod State University, 65 Il’insky Street, Nizhny Novgorod 603950, RussiaIoffe Physical-Technical Institute of the Russian Academy of Sciences, 26 Polytechnicheskaya Street St., Petersburg 194021, RussiaIoffe Physical-Technical Institute of the Russian Academy of Sciences, 26 Polytechnicheskaya Street St., Petersburg 194021, RussiaExperimental data on diffusion of erbium and vanadium in porous and nonporous silicon carbide at 1700 and 2200°C have been used for modelling diffusion in porous SiC. It is shown that the consideration of pore structure modification under annealing via vacancy redistribution allows for satisfactory description of dopant diffusion. As expected, important contribution to the diffusion in the porous medium is found to be made by the walls of the pores: in SiC, the vacancy surface diffusion coefficient on the walls appears to exceed that in the bulk of the material by an order of magnitude. When thermal treatment transforms pore channels into closed voids, pathways for accelerated diffusion cease to exist and diffusion rates in porous and nonporous SiC become similar.http://dx.doi.org/10.1155/2012/439617
spellingShingle Marina G. Mynbaeva
Evgeny L. Pankratov
Evgeniy N. Mokhov
Karim D. Mynbaev
Analysis of Erbium and Vanadium Diffusion in Porous Silicon Carbide
Advances in Condensed Matter Physics
title Analysis of Erbium and Vanadium Diffusion in Porous Silicon Carbide
title_full Analysis of Erbium and Vanadium Diffusion in Porous Silicon Carbide
title_fullStr Analysis of Erbium and Vanadium Diffusion in Porous Silicon Carbide
title_full_unstemmed Analysis of Erbium and Vanadium Diffusion in Porous Silicon Carbide
title_short Analysis of Erbium and Vanadium Diffusion in Porous Silicon Carbide
title_sort analysis of erbium and vanadium diffusion in porous silicon carbide
url http://dx.doi.org/10.1155/2012/439617
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