The Effect of Various Factors on the Resistance and TCR of RuO2 Thick Film Resistors—Relation Between the Electrical Properties and Particle Size of Constituents, the Physical Properties of Glass and Firing Temperature
Thick film resistors were prepared with different variables, they included various conductive particle sizes, glass particle sizes, glass softening temperatures, thermal expansion coefficients of the glass, mixing ratios of the conductive element and glass, firing temperatures, firing cycles, etc. T...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
1988-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1988/67016 |
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| Summary: | Thick film resistors were prepared with different variables, they included various
conductive particle sizes, glass particle sizes, glass softening temperatures, thermal
expansion coefficients of the glass, mixing ratios of the conductive element and glass,
firing temperatures, firing cycles, etc. The relation between these factors and electrical
properties of the thick film resistors was studied. As a result, it was found that when
a specific glass is chosen, its R-TCR curve, which indicates the relation between
resistance and TCR of a thick film resistor, is unconditionally fixed regardless of
various preparation factors, and the R-TCR curve can be moved only by changing the
thermal expansion coefficient of the glass. In addition, the higher the resistance and
the larger the thermal expansion coefficient of glass, the larger the resistance change
against the external force. |
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| ISSN: | 0882-7516 1563-5031 |