Atomic‐Scale Mechanisms of Nucleation and Stabilization in CuCrO2 and CuFeO2 Delafossite Thin Films on Al2O3

Atomic‐Scale Mechanisms of Nucleation and Stabilization in CuCrO2 and CuFeO2 Delafossite Thin Films on Al2O3

Abstract Delafossite thin films exhibit a range of intriguing physical properties derived from their layered structure, which consists of alternating noble metal (A+) and (BO2−) sublayers in an ABO2 stoichiometry. The integration of these properties into functional devices requires the successful ep...

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Bibliographic Details
Main Authors: Anna Scheid, Qi Song, Stephanie Ribet, Colin Ophus, Y. Eren Suyolcu, Darrell G. Schlom, Tobias Heil, Peter A. van Aken
Format: Article
Language:English
Published: Wiley-VCH 2025-06-01
Series:Advanced Materials Interfaces
Subjects:
delafossites
electron ptychography
growth mechanism
interfacial reconstruction
MBE
Online Access:https://doi.org/10.1002/admi.202500218
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