APA (7th ed.) Citation

Mo, H., Zhang, Y., & Song, H. Design Tradeoff of Hot Carrier Immunity and Robustness in LDMOS with Grounded Gate Shield. Wiley.

Chicago Style (17th ed.) Citation

Mo, Haifeng, Yaohui Zhang, and Helun Song. Design Tradeoff of Hot Carrier Immunity and Robustness in LDMOS with Grounded Gate Shield. Wiley.

MLA (9th ed.) Citation

Mo, Haifeng, et al. Design Tradeoff of Hot Carrier Immunity and Robustness in LDMOS with Grounded Gate Shield. Wiley.