He, C., Yang, S., Liu, Z., & Wu, B. Damage Localization and Quantification of Truss Structure Based on Electromechanical Impedance Technique and Neural Network. Wiley.
Chicago Style (17th ed.) CitationHe, Cunfu, Shen Yang, Zenghua Liu, and Bin Wu. Damage Localization and Quantification of Truss Structure Based on Electromechanical Impedance Technique and Neural Network. Wiley.
MLA (9th ed.) CitationHe, Cunfu, et al. Damage Localization and Quantification of Truss Structure Based on Electromechanical Impedance Technique and Neural Network. Wiley.
Warning: These citations may not always be 100% accurate.