Circuit Modeling of the Impact of Heavy Charged Particles on Transient Processes in Bipolar Analog Microcircuits
One of the factors causing the failure of spacecraft integrated circuits is exposure to heavy charged particles. The entry of heavy charged particles into electronic devices leads to the appearance of single event transients (short current pulses), which in analog microcircuits manifest themselves i...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | Russian |
| Published: |
Educational institution «Belarusian State University of Informatics and Radioelectronics»
2024-10-01
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| Series: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
| Subjects: | |
| Online Access: | https://doklady.bsuir.by/jour/article/view/3979 |
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