Application of bias correction methods to improve U3Si2 sample preparation for quantitative analysis by WDXRF

Application of bias correction methods to improve U3Si2 sample preparation for quantitative analysis by WDXRF

The determination of silicon (Si), total uranium (U) and impurities in uranium-silicide (U3Si2) samples by wavelength dispersion X-ray fluorescence technique (WDXRF) has been already validated and is currently implemented at IPEN’s X-Ray Fluorescence Laboratory (IPEN-CNEN/SP) in São Paulo, Brazil. S...

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Bibliographic Details
Main Author:	Marcos Antonio Scapin
Format:	Article
Language:	English
Published:	Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR) 2019-02-01
Series:	Brazilian Journal of Radiation Sciences
Subjects:	u3si2 xrf wdxrf.
Online Access:	https://bjrs.org.br/revista/index.php/REVISTA/article/view/582
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