Enhancing Reliability in Redundant Homogeneous Sensor Arrays with Self-X and Multidimensional Mapping
Mechanical defects and sensor failures can substantially undermine the reliability of low-cost sensors, especially in applications where measurement inaccuracies or malfunctions may lead to critical outcomes, including system control disruptions, emergency scenarios, or safety hazards. To overcome t...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-06-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/25/13/3841 |
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