L, A. V. V., Dawe, C. A., Vanjari, S. C., Markevich, V. P., Halsall, M. P., Peaker, A. R., . . . Kuball, M. Characterization of deep-level defects in OFZ grown Nb-doped β-Ga2O3 single crystals. AIP Publishing LLC.
Chicago Style (17th ed.) CitationL, Ananthu Vijayan V., Christopher A. Dawe, Sai Charan Vanjari, Vladimir P. Markevich, Matthew P. Halsall, Anthony R. Peaker, Moorthy Babu Sridharan, and Martin Kuball. Characterization of Deep-level Defects in OFZ Grown Nb-doped β-Ga2O3 Single Crystals. AIP Publishing LLC.
MLA (9th ed.) CitationL, Ananthu Vijayan V., et al. Characterization of Deep-level Defects in OFZ Grown Nb-doped β-Ga2O3 Single Crystals. AIP Publishing LLC.
Warning: These citations may not always be 100% accurate.