过饱和多址系统中QPSK树型最佳检测及性能分析

过饱和多址系统中QPSK树型最佳检测及性能分析

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Bibliographic Details
Main Authors: 毕见鑫, 王映民, 易克初
Format: Article
Language:zho
Published: Editorial Department of Journal on Communications 2001-01-01
Series:Tongxin xuebao
Online Access:http://www.joconline.com.cn/zh/article/74368254/
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