A Low-Cost Arduino-Based I–V Curve Tracer with Automated Load Switching for PV Panel Characterization
Accurate photovoltaic (PV) panel characterization is critical for optimizing renewable energy systems, but it is often hindered by the high cost of commercial tracers or the slow, error-prone nature of manual methods. This paper presents a low-cost, Arduino-based I–V curve tracer that overcomes thes...
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| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-07-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/15/15/8186 |
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| Summary: | Accurate photovoltaic (PV) panel characterization is critical for optimizing renewable energy systems, but it is often hindered by the high cost of commercial tracers or the slow, error-prone nature of manual methods. This paper presents a low-cost, Arduino-based I–V curve tracer that overcomes these limitations through fully automated resistive load switching. By integrating a relay-controlled resistor bank managed by a single microcontroller, the system eliminates the need for manual intervention, enabling rapid and repeatable measurements in just 45 s. This rapid acquisition is a key advantage over manual systems, as it minimizes the impact of fluctuating environmental conditions and ensures the resulting I–V curve represents a stable operating point. Compared to commercial alternatives, our open-source solution offers significant benefits in cost, portability, and flexibility, making it ideal for field deployment. The system’s use of fixed, stable resistive loads for each measurement point also ensures high repeatability and straightforward comparison with theoretical models. Experimental validation demonstrated high agreement with a single-diode PV model, achieving a mean absolute percentage error (MAPE) of 4.40% against the manufacturer’s data. Furthermore, re-optimizing the model with field-acquired data reduces the MAPE from 18.23% to 7.06% under variable irradiance. This work provides an accessible, robust, and efficient tool for PV characterization, democratizing access for research, education, and field diagnostics. |
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| ISSN: | 2076-3417 |