Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements
A microwave method is devised to extract relative complex permittivity (<inline-formula> <tex-math notation="LaTeX">$\varepsilon _{r}$ </tex-math></inline-formula>) of medium- or low-loss dielectric samples. It is simpler, non-iterative, reference-plane-invariant (R...
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| Format: | Article |
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IEEE
2024-01-01
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| Series: | IEEE Access |
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| Online Access: | https://ieeexplore.ieee.org/document/10716378/ |
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| author | Ugur Cem Hasar Husain Ali Yunus Kaya Ivaylo Stoyanov |
| author_facet | Ugur Cem Hasar Husain Ali Yunus Kaya Ivaylo Stoyanov |
| author_sort | Ugur Cem Hasar |
| collection | DOAJ |
| description | A microwave method is devised to extract relative complex permittivity (<inline-formula> <tex-math notation="LaTeX">$\varepsilon _{r}$ </tex-math></inline-formula>) of medium- or low-loss dielectric samples. It is simpler, non-iterative, reference-plane-invariant (RPI), and applicable for one-port waveguide measurements with short-circuit termination only. Besides, since it uses short-circuit termination reflection-only measurements, it is free from Fabry-Pérot resonances. Permittivity measurements of polyvinyl chloride (PVC) and polypropylene (PP) are performed at X-band (<inline-formula> <tex-math notation="LaTeX">$8.2-12.4$ </tex-math></inline-formula> GHz) to examine the performance of the proposed method considering different scenarios involving inaccurate information of sample location in the cell and inaccurate knowledge of the sample thickness. Repeatability analysis is carried out to analyze the performance of the proposed method against other similar methods in the literature. |
| format | Article |
| id | doaj-art-950f148af0b54fed8ab25efbee2f6d27 |
| institution | OA Journals |
| issn | 2169-3536 |
| language | English |
| publishDate | 2024-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj-art-950f148af0b54fed8ab25efbee2f6d272025-08-20T02:09:52ZengIEEEIEEE Access2169-35362024-01-011215106315107410.1109/ACCESS.2024.347931110716378Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port MeasurementsUgur Cem Hasar0https://orcid.org/0000-0002-6098-7762Husain Ali1https://orcid.org/0000-0002-3573-7884Yunus Kaya2https://orcid.org/0000-0002-2380-5915Ivaylo Stoyanov3https://orcid.org/0000-0001-9824-1504Department of Electrical and Electronics Engineering, Gaziantep University, Gaziantep, TürkiyeDepartment of Electrical and Electronics Engineering, Gaziantep University, Gaziantep, TürkiyeDepartment of Electronics and Automation, Bayburt University, Bayburt, TürkiyeDepartment of Electrical and Power Engineering, University of Ruse “Angel Kanchev,”, Ruse, BulgariaA microwave method is devised to extract relative complex permittivity (<inline-formula> <tex-math notation="LaTeX">$\varepsilon _{r}$ </tex-math></inline-formula>) of medium- or low-loss dielectric samples. It is simpler, non-iterative, reference-plane-invariant (RPI), and applicable for one-port waveguide measurements with short-circuit termination only. Besides, since it uses short-circuit termination reflection-only measurements, it is free from Fabry-Pérot resonances. Permittivity measurements of polyvinyl chloride (PVC) and polypropylene (PP) are performed at X-band (<inline-formula> <tex-math notation="LaTeX">$8.2-12.4$ </tex-math></inline-formula> GHz) to examine the performance of the proposed method considering different scenarios involving inaccurate information of sample location in the cell and inaccurate knowledge of the sample thickness. Repeatability analysis is carried out to analyze the performance of the proposed method against other similar methods in the literature.https://ieeexplore.ieee.org/document/10716378/Material characterizationnon-iterativeone-port measurementpermittivityshort-termination |
| spellingShingle | Ugur Cem Hasar Husain Ali Yunus Kaya Ivaylo Stoyanov Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements IEEE Access Material characterization non-iterative one-port measurement permittivity short-termination |
| title | Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements |
| title_full | Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements |
| title_fullStr | Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements |
| title_full_unstemmed | Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements |
| title_short | Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements |
| title_sort | simpler reference plane invariant method for permittivity extraction of medium or low loss dielectric samples using one port measurements |
| topic | Material characterization non-iterative one-port measurement permittivity short-termination |
| url | https://ieeexplore.ieee.org/document/10716378/ |
| work_keys_str_mv | AT ugurcemhasar simplerreferenceplaneinvariantmethodforpermittivityextractionofmediumorlowlossdielectricsamplesusingoneportmeasurements AT husainali simplerreferenceplaneinvariantmethodforpermittivityextractionofmediumorlowlossdielectricsamplesusingoneportmeasurements AT yunuskaya simplerreferenceplaneinvariantmethodforpermittivityextractionofmediumorlowlossdielectricsamplesusingoneportmeasurements AT ivaylostoyanov simplerreferenceplaneinvariantmethodforpermittivityextractionofmediumorlowlossdielectricsamplesusingoneportmeasurements |