Hasar, U. C., Ali, H., Kaya, Y., & Stoyanov, I. Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements. IEEE.
Chicago Style (17th ed.) CitationHasar, Ugur Cem, Husain Ali, Yunus Kaya, and Ivaylo Stoyanov. Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements. IEEE.
MLA (9th ed.) CitationHasar, Ugur Cem, et al. Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements. IEEE.
Warning: These citations may not always be 100% accurate.