Zhang, N., Ying, S., Zhu, K., & Zhu, D. Software defect prediction based on stacked sparse denoising autoencoders and enhanced extreme learning machine. Wiley.
Chicago Style (17th ed.) CitationZhang, Nana, Shi Ying, Kun Zhu, and Dandan Zhu. Software Defect Prediction Based on Stacked Sparse Denoising Autoencoders and Enhanced Extreme Learning Machine. Wiley.
MLA (9th ed.) CitationZhang, Nana, et al. Software Defect Prediction Based on Stacked Sparse Denoising Autoencoders and Enhanced Extreme Learning Machine. Wiley.
Warning: These citations may not always be 100% accurate.