Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device
This study developed an integrated global-local approach for locating damage on building structures. A damage detection approach with a novel embedded frequency response function damage index (NEFDI) was proposed and embedded in the Imote2.NET-based wireless structural health monitoring (SHM) system...
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| Format: | Article |
| Language: | English |
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Wiley
2014-01-01
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| Series: | The Scientific World Journal |
| Online Access: | http://dx.doi.org/10.1155/2014/729027 |
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| _version_ | 1849402813260496896 |
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| author | Tzu-Hsuan Lin Yung-Chi Lu Shih-Lin Hung |
| author_facet | Tzu-Hsuan Lin Yung-Chi Lu Shih-Lin Hung |
| author_sort | Tzu-Hsuan Lin |
| collection | DOAJ |
| description | This study developed an integrated global-local approach for locating damage on building structures. A damage detection approach with a novel embedded frequency response function damage index (NEFDI) was proposed and embedded in the Imote2.NET-based wireless structural health monitoring (SHM) system to locate global damage. Local damage is then identified using an electromechanical impedance- (EMI-) based damage detection method. The electromechanical impedance was measured using a single-chip impedance measurement device which has the advantages of small size, low cost, and portability. The feasibility of the proposed damage detection scheme was studied with reference to a numerical example of a six-storey shear plane frame structure and a small-scale experimental steel frame. Numerical and experimental analysis using the integrated global-local SHM approach reveals that, after NEFDI indicates the approximate location of a damaged area, the EMI-based damage detection approach can then identify the detailed damage location in the structure of the building. |
| format | Article |
| id | doaj-art-94944d0053884ffdb4afaabb07e5251e |
| institution | Kabale University |
| issn | 2356-6140 1537-744X |
| language | English |
| publishDate | 2014-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | The Scientific World Journal |
| spelling | doaj-art-94944d0053884ffdb4afaabb07e5251e2025-08-20T03:37:27ZengWileyThe Scientific World Journal2356-61401537-744X2014-01-01201410.1155/2014/729027729027Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement DeviceTzu-Hsuan Lin0Yung-Chi Lu1Shih-Lin Hung2Sinotech Engineering Consultants, Inc., No. 280, Xinhu 2nd Road, Neihu Distict, Taipei 11494, TaiwanDepartment of Civil Engineering, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu 300, TaiwanDepartment of Civil Engineering, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu 300, TaiwanThis study developed an integrated global-local approach for locating damage on building structures. A damage detection approach with a novel embedded frequency response function damage index (NEFDI) was proposed and embedded in the Imote2.NET-based wireless structural health monitoring (SHM) system to locate global damage. Local damage is then identified using an electromechanical impedance- (EMI-) based damage detection method. The electromechanical impedance was measured using a single-chip impedance measurement device which has the advantages of small size, low cost, and portability. The feasibility of the proposed damage detection scheme was studied with reference to a numerical example of a six-storey shear plane frame structure and a small-scale experimental steel frame. Numerical and experimental analysis using the integrated global-local SHM approach reveals that, after NEFDI indicates the approximate location of a damaged area, the EMI-based damage detection approach can then identify the detailed damage location in the structure of the building.http://dx.doi.org/10.1155/2014/729027 |
| spellingShingle | Tzu-Hsuan Lin Yung-Chi Lu Shih-Lin Hung Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device The Scientific World Journal |
| title | Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device |
| title_full | Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device |
| title_fullStr | Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device |
| title_full_unstemmed | Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device |
| title_short | Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device |
| title_sort | locating damage using integrated global local approach with wireless sensing system and single chip impedance measurement device |
| url | http://dx.doi.org/10.1155/2014/729027 |
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