Lin, T., Lu, Y., & Hung, S. Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device. Wiley.
Chicago Style (17th ed.) CitationLin, Tzu-Hsuan, Yung-Chi Lu, and Shih-Lin Hung. Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device. Wiley.
MLA (9th ed.) CitationLin, Tzu-Hsuan, et al. Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device. Wiley.
Warning: These citations may not always be 100% accurate.