An Event Log Repair Method Based on Masked Transformer Model
The effectiveness of business process analysis heavily relies on the quality of event logs. However, the presence of outliers and missing values often compromises the integrity of event logs, consequently exerting adverse effects on process analysis and associated decision-making. Existing log repai...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Taylor & Francis Group
2024-12-01
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| Series: | Applied Artificial Intelligence |
| Online Access: | https://www.tandfonline.com/doi/10.1080/08839514.2024.2346059 |
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